Abstract
Image charge interaction reported by Ishii et. al.1 at Cu/Y2O3-fully stabilized cubic ZrO2 interfaces produced in the thermal evaporation method, was reproduced on a personal computer simply with classical electrodynamics. The difference in the interfacial adhesion force was observed between continuum/ZrO2 (110) (a neutral plane) and continuum/ZrO2 (001) (polarized plane) even if no quantum mechanical computation was done. Continuum/ZrO2 (001) showed stronger adhesion force than that of continuum/ZrO2 (001) at large interfacial interval. This result indicates that the image charge interaction works in a long range.
