Journal of Advanced Science
Online ISSN : 1881-3917
Print ISSN : 0915-5651
ISSN-L : 0915-5651
Structural characterization of Bi12GeO20 film for image recording
Kenji ISSHINHayato NAGASEHiroshi MUROTANITakehisa SHIBUYAMoriaki WAKAKIHidetoshi KATSUMA
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2001 Volume 13 Issue 1-2 Pages 82-83

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Abstract
The photorefractive single crystal bulk samples have been used for image recording. Films of Bi12GeO20 (BGO) were deposited by using RF magnetron sputtering. Thin films have merits in device integration and mass production. BGO films were fabricated on the substrates composed of glasses (CORNING 7059) and ITO films. The relationship between optical properties and process condition was studied to obtain a good crystalline film. The film with crystalline phase only was obtained on both substrates at the substrate temperatures above 200°C. BGO films with two type of structure were deposited on ITO films.
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