Abstract
The paper describes two automatic measuring systems for testing high Tc superconductor thin films. In these experimental equipments data translations from measuring devices to personal computer are realised through standard KEITHLEY 570 data acquisition system and through GPIB interface. The measurements of the films resistivity are performed by an AC four probe technique. The contacts are prepared by the method which allows to decrease contact resistance more than 106 times. The measurements of critical current are carried out on the samples in the form of microbridges prepared by photolithography. The experimental results of YBa2Cu3Ox superconductor temperature dependence of electrical resistivity are presented.
