Journal of Advanced Science
Online ISSN : 1881-3917
Print ISSN : 0915-5651
ISSN-L : 0915-5651
An APFIM analysis of modulated structure in Ni-Ti alloy
FIM Image by computer simulation
Isao KOBATAKE, Kiyoshi HORIIKE, Tsunenori SUZUKI
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Keywords: Fild Ion Microscope, Ni-11at%Ti, Modulated structure
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1996 Volume 8 Issue 1-2 Pages 95-96

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Abstract
FIM image is investigated using computer simulation for modulated structure of Ni-11at%Ti. We obtain the dark part in the computing FIM image as a result of the influence of field evaporation for modulated structure.
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