Abstract
Photovoltaic power involves many solar battery cells constituted by a polycrystalline or single crystal silicon wafer. Therefore, the conversion efficiency from solar to electrical energy of each cell is very important. Recently, a fixed grain wire method is employed in a slicing process. Thus, the wire surface topography must be obtained to sustain reliable accuracy. In this paper, a method for measurement of diamond wire surface topography using image processing is proposed. In this method, the distribution of grains on the surface can be expressed numerically after extracting grains from the captured images.
