Netsu Sokutei
Online ISSN : 1884-1899
Print ISSN : 0386-2615
ISSN-L : 0386-2615
Scanning Probe Microscopic Measurements at Low Temperatures
Tetsuya HasegawaSohei Okazaki
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2005 Volume 32 Issue 5 Pages 218-225

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Abstract
Scanning tunneling microscopes (STM) that can operate under UHV at low temperatures have been developed. STM observations of Bi-based oxide superconductors have shown that Pb atoms occupying Bi sites and Sr-site defects could be imaged selectively by appropriately setting bias voltage. Furthermore, scanning tunneling spectroscopic measurements have successfully visualized electronic phase separation into superconducting and non-superconducting domains. A variable temperature SPM instrument with sub-micron scale resolution and wide scanning range up to 15mm has also been constructed. The instrument enables us to measure local magnetic and electric properties by using a miniature SQUID sensor and cylindrical resonator tube, respectively, as scanning probes. The former was applied to direct observation of vortices trapped in La1-xSrxCuO4. The latter was utilized to investigate conductivity of a Mn-based oxide, Nd1-xSrxMnO3, as functions of chemical composition x and temperature, in a systematic manner.
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© Japan Society of Calorimetry and Thermal Analysis
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