Whole Pattern Fitting for Two-Dimensional Diffraction Patterns from Polycrystalline Materials

Abstract

  Angle dispersive powder x-ray diffraction experiments using a flat imaging plate (IP) are one of the most popular methods to study high-pressure material science. An intensity distribution on Debye rings involves information of the number of crystallites, lattice preferred orientation, and lattice strains under stress. The developed computer software by the author simulates the Debye-ring pattern with given parameters including above ones and makes a 2D whole pattern fitting to observed images.