The Review of High Pressure Science and Technology
Online ISSN : 1348-1940
Print ISSN : 0917-639X
ISSN-L : 0917-639X
Reviews—Spectroscopy under High Pressure—
Local Structure Analyses by XAFS and Perspective for the Measurements under High Pressure
Takafumi MIYANAGA
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JOURNAL FREE ACCESS

2015 Volume 25 Issue 1 Pages 27-37

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Abstract
In this article, the possibilities of the applications of XAFS (X-ray absorption fine structure) to the high-pressure measurements are discussed. XAFS is a unique technique for the local structure analysis with element selective method for liquids, amorphous and crystalline solids, thin films, surfaces, and nanoparticles. Various examples of XAFS studies for materials science; nanoparticles, magnetic alloys and their transition, ferroelectric materials and the structural transition, molybdenum polyanion, chemical reaction, are presented, in which several elements are included in the system so complex interactions play important roles in the structural, electrical, magnetic and chemical dynamics. The future perspectives of the high-pressure XAFS study for such unique systems are proposed.
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© 2015 The Japan Society of High Pressure Science and Technology
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