Abstract
High pressure in situ X-ray diffraction measurements have been carried out using Drickamer-type high pressure apparatus. Observations were made in two independent directions relative to the compression axis. Observed strains varied systematically in the two directions depending on the Miller indices of the diffraction lines. These systematic variations can be explained by the combined effect of uniaxial compression and the elastic anisotropy of crystals. Present results indicate that careful analysis is required to derive pressure value and equation of state from in situ X-ray diffraction study.
