Correlation between Boson Peals and First Sharp Diffraction Peaks in Permanently Densified SiO₂ and GeO₂ Glass

Abstract

The correlation between the boson peak and the first diffraction peak, both of which are characteristic properties in amorphous material, was investigated on permanently densified SiO₂ and GeO₂ glass recovered from high pressures using Raman scattering and x-ray diffraction. The boson peak energy keeps inverse proportionality to the correlation length estimated from the width of the first sharp diffraction peak. Universality of this relation is pointed out for the application to other degree of freedom with short-range correlation, for example, a spin gap in a spin liquid state. A model for the boson peak and the first sharp diffraction peak is proposed.