Proceedings of the Annual Conference of Japan Society of Material Cycles and Waste Management
The 24th Annual Conference of Japan Society of Material Cycles and Waste Management
Session ID : E3-6Poster1
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Host: Japan Society of Material Cycles and Waste Management

Examination of wipe test in the low-concentrated PCB component waste
masayoshi kobayashi, yukihiro ohoka, *nobuo ogura, takuya midorikawa
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Keywords: low-concentrated PCB component waste, wipe test, PCB waste disposal
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[in Japanese]

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© 2013 Japan Society of Material Cycles and Waste Management
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Proceedings of the Annual Conference of The Japan Society of Waste Management Experts

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