Electrodeposition Stress Measurement of a Sphere by X-Ray in Depositing Method

Abstract

The authors classified measuring methods of internal stress in deposited layer into two kinds, i.e., depositing method and removing method, and proposed a series of the measuring theories for a plate, a cylinder and a sphere. In the present paper, they propose a new method of applying X-ray to a multi-layered sphere in depositing process and show a compensating formula about a measured stress for the difference between base temperature and measuring one in the case of a two-layered sphere. As application of their theory, they measured the internal stresses of two-layered spheres chromium deposited under two different conditions on steel balls and compared the results with those obtained by applying the removing method to the same specimen.