1980 Volume 23 Issue 175 Pages 9-12
Considering a physical phenomenon of contribution of the internal stress in definite subsurface layer of metal to the X-ray diffraction, the authors derive a general fundamental formula existing between measured stress and internal stress. Then they propose the exact theories of residual stress measurement for the Front Surface Method and the Back Surface Method by successive thin layer removal in a plate, and show an example of application by characteristic X-rays of Cr and Co.
JSME International Journal Series C Mechanical Systems, Machine Elements and Manufacturing
JSME International Journal Series B Fluids and Thermal Engineering
JSME International Journal Series A Solid Mechanics and Material Engineering
JSME international journal. Ser. C, Dynamics, control, robotics, design and manufacturing
JSME international journal. Ser. 3, Vibration, control engineering, engineering for industry
JSME international journal. Ser. A, Mechanics and material engineering
JSME international journal. Ser. 1, Solid mechanics, strength of materials