2006 Volume 49 Issue 3 Pages 376-381
The surface aberration effect in the strain scanning method with a Ge analyzer was examined using high- energy X-rays from the undulator synchrotron source. The synchrotron X-rays from the undulator source had an enough intensity for the strain scanning method using a goniometer with the analyzer. The use of a Ge (111) analyzer showed remarkable reduction of the surface aberration effect. However, there still existed the surface aberration for the very-near surface region from the surface to the depth of 50µm. A correction method was proposed by taking into account of the effects of the divergence of the Ge analyzer, the mis-setting of the analyzer and the X-ray attenuation. The proposed correction method was very useful for eliminating the surface aberration effect. The correction method enables a high space-resolutive evaluation of the subsurface stress distribution. The method was successfully applied to the determination of the residual stress distribution of the shot-peened steel. A precise d0 value of the strain-free lattice spacing necessary was determined from the surface stress measured by the conventional sin2ψ method using Cr-Kα radiation.
JSME international journal. Ser. 1, Solid mechanics, strength of materials
JSME international journal. Ser. A, Mechanics and material engineering
JSME international journal. Ser. 3, Vibration, control engineering, engineering for industry
JSME international journal. Ser. C, Dynamics, control, robotics, design and manufacturing