JSME international journal. Ser. 1, Solid mechanics, strength of materials
Print ISSN : 0914-8809
STM Images of Surface Films Produced at Elevated Temperatures
Saburo MATSUOKAHiroyuki MASUDAYuji IKEDAKazuhiro AKAIKEYasuo OCHI
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1992 Volume 35 Issue 4 Pages 456-461

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Abstract

The scanning tunneling microscope (STM) has an atomic-level resolution. Oxide film is always formed at elevated temperatures in air. Therefore, STM observation of surface films is useful for investigating the basic mechanisms of damage such as oxidation and creep at elevated temperatures. In this study, the oxide films on nickel and iron, and the sulfur-segregated surfaces on iron and SUS304 steel were observed with STM at room temperatures in air. The images of these films were obtained under a high bias voltage such as 2V, in comparison with ordinary voltage such as 20mV. This was justified by the fact that the films were semiconductors.

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© The Japan Society of Mechanical Engineers
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