The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
Online ISSN : 2424-2837
2011.10
Session ID : OS04-1-2
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OS04-1-2 Microstructural Characterization of Nanocrystalline Nickel Films by X-Ray Diffraction
Keisuke Tanaka, Masashi Skakibara, Hiroto Tanaka, Hiroshi Kimachi
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Keywords: Nanocrystal, Nickel Thin Films, Electrdeposition, X-Ray Diffraction, Grain Size, Tensile Deformation, Full Width at Half Maximum
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© 2011 The Japan Society of Mechanical Engineers
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