The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
Online ISSN : 2424-2837
2011.10
Session ID : OS20-3-4
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OS20-3-4 Thermal fatigue behavior of 35nm thick Au interconnects under alternating current loading
Xue Ling, Lijuan Sun, Xide Li
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Keywords: alternating current, ultra-thin interconnect, thermal fatigue, four-probe method
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© 2011 The Japan Society of Mechanical Engineers
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Proceedings of the Asian Pacific Conference on Fracture and Strength and International Conference on Advanced Technology in Experimental Mechanics

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