OS1-10 Phase-shifting moire technique at low scanning resolution under a laser microscope for micron/submicron-scale deformation measurement(Shape and deformation measurement 1,OS1 Advances in optical methods and techniques,MEASUREMENT METHODS)

Qinghua Wang; Shien Ri; Yanjie Lie

doi:10.1299/jsmeatem.2015.14.14

The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics

Online ISSN : 2424-2837

2015.14

Session ID : OS1-10

DOI https://doi.org/10.1299/jsmeatem.2015.14.14

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OS1-10 Phase-shifting moire technique at low scanning resolution under a laser microscope for micron/submicron-scale deformation measurement(Shape and deformation measurement 1,OS1 Advances in optical methods and techniques,MEASUREMENT METHODS)

Qinghua Wang, Shien Ri, Yanjie Lie

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