OS3-4 Depth-resolved Strain Distribution Measurement by Synchrotron X-ray 2-dimensional Diffraction(Stress/strain evaluation,OS3 Stress/strain analyses by diffraction method,MEASUREMENT METHODS)

Hidehiko Kimura; Daigo Setoyama; Satoshi Yamaguchi; Yoshiharu Hirose; Yuka Kojima; Minoru Takahara

doi:10.1299/jsmeatem.2015.14.38

The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics

Online ISSN : 2424-2837

2015.14

Session ID : OS3-4

DOI https://doi.org/10.1299/jsmeatem.2015.14.38

Conference information

OS3-4 Depth-resolved Strain Distribution Measurement by Synchrotron X-ray 2-dimensional Diffraction(Stress/strain evaluation,OS3 Stress/strain analyses by diffraction method,MEASUREMENT METHODS)

Hidehiko Kimura, Daigo Setoyama, Satoshi Yamaguchi, Yoshiharu Hirose, Yuka Kojima, Minoru Takahara

Author information

CONFERENCE PROCEEDINGS RESTRICTED ACCESS

Details

Article 1st page

Content from these authors

Favorites & Alerts

Corresponding author

Register with J-STAGE for free!