The Proceedings of The Computational Mechanics Conference
Online ISSN : 2424-2799
2001.14
Session ID : 440
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440 Prediction of Electromigration Failure in Passivated Polycrystalline Line by Using Governing Parameter of Electromigration Damage
Kazuhiko SASAGAWAMasataka HASEGAWAMasumi SAKAHiroyuki ABE
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© 2001 The Japan Society of Mechanical Engineers
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