The Proceedings of The Computational Mechanics Conference
Online ISSN : 2424-2799
2005.18
Session ID : 203
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203 Threshold Current Density of Electromigration Damage in Polycrystalline Line with Two-Dimensional Shape
Kazuhiko SASAGAWA, Nao YAMAJI, Shigeo UNO
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Keywords: Electromigration, Atomic Flux Divergence, Drift, Polycrystalline Line, Threshold Current Density
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© 2005 The Japan Society of Mechanical Engineers
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