The Proceedings of Design & Systems Conference
Online ISSN : 2424-3078
2002.12
Conference information
Pattern recognition of contour image by using the self-organizing map
[in Japanese][in Japanese][in Japanese][in Japanese]
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 442-443

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Abstract
We have proposed an effective pattern recognition method for contour image by extracting general and local features. In this method, firstly object is seen perspectively to identify class and secondly seen in detail to identify individual object. The images in the database must be classified to carry out flexible pattern recognition. This paper describes a method to classify images in the database by using Self-Organizing Maps (SOM) and to determine a prototype each class. And we show the result of applying our system to illustrated insects reference book.
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© 2002 The Japan Society of Mechanical Engineers
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