The Proceedings of Design & Systems Conference
Online ISSN : 2424-3078
2003.13
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On the new logic devices for artifacts in harsh environment
Hiroyuki TakahashiYoshiki Shimomura
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 27-28

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Abstract
In harsh radiation environment, conventional semiconductor devices are not usable for their high sensitivity to the crystal defects. In place of conventional semiconductors, we propose a new gas-microelectronics based on narrow strips and control grids operated in a noble gas. Basic structures and possible logic devices based on this method is shown in terms of micro fabrication techniques.
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© 2003 The Japan Society of Mechanical Engineers
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