The Proceedings of Design & Systems Conference
Online ISSN : 2424-3078
2003.13
Conference information
Drop Test Analysis of Assembled Box for Opitical DISK
Misao INOKEMasanori MOTEGIShinichirou OKAMOTOShigeru KAGAWAKeinosuke MIYAZAKI
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 365-366

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Abstract
Fujitsu has developed the drop test analysis technology of PET wrapping structure of the magnetic disk and corrugated cardboard wrapping structure of mobile PC. The optical disk unit is transported by corrugated cardboard box. This time, an analysis technology to design the buffer structure to the dropping impact was constructed. The automatic contact function was used because there were a lot of contact conditions. Stress strain warp curve of the corrugated cardboard was measured. We simulated the acceleration and the action time. We achieved the good correlation of analysis and experiment and will introduce this simulation technology in this announcement.
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© 2003 The Japan Society of Mechanical Engineers
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