The Proceedings of the Conference on Information, Intelligence and Precision Equipment : IIP
Online ISSN : 2424-3140
2016
Session ID : H-1-3
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Application of ellipsometric microscope to gap measuement
Kenji FukuzawaChihiro YamashitaShintaro ItohHedong Zhang
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Abstract

Gap measurement is essential to clarification of lubrication phenomena at nano-meter gaps; however, there are no well-established methods. We present a new method for measuring the distribution of nano-meter sliding gaps. Vertical-objective-type ellipsometric microscope (VEM) was applied to sliding gap measurements. Feasibility of the method for the nano-meter gap measurement was demonstrated.

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© 2016 The Japan Society of Mechanical Engineers
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