The Proceedings of Conference of Kansai Branch
Online ISSN : 2424-2756
2000.75
Session ID : 108
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108 AFM Observation around Fatigue Crack Tip by AFM and Image Processing Analysis
Yoshihiko Uematsu
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Since fatigue crack growth phenomenon is considered to be intrinsically localized, microscopical observation is an effective technique to elucidate the fatigue crack growth mechanism and large number of microscopic studies have been made. In this study, growth behavior of fatigue crack was observed by using an atomic force microscope (AFM), and crack growth mechanism was discussed.
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© 2000 The Japan Society of Mechanical Engineers
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