The Proceedings of Conference of Kansai Branch
Online ISSN : 2424-2756
2003.78
Conference information
Influence of Frequency of RF Power on Decomposition of Semiconductor Processing Gas using Inductively Coupled Plasma at low Pressure
Shingo TANAKAJunko MINETomoyuki KUROKIMasaaki OKUBOToshiaki YAMAMOTONoboru SAEKI
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Pages _13-3_-_13-4_

Details
Abstract
CF_4 is one of the most stable gases among semiconductor processing gases and their decomposition is extremely difficult. Influence of frequency of radio frequency (RF) power on decomposition of CF_4 using inductively coupled plasma (ICP) reactor at low pressure was investigated. The frequency of RF power supply is 2MHz or 4MHz. With each frequency, complete decomposition can be obtained with certain operately conditions of ICP such as the total flow rate, the ratio of CF_4 to O_2,and RF power. The detailed discussion is presented in this paper.
Content from these authors
© 2003 The Japan Society of Mechanical Engineers
Previous article Next article
feedback
Top