20705 Development of Wide-Spectral-Range High-Speed Spectroscopy for Measuring Specular Reflectance, Hemispherical Reflectance and Directional Emittance of Surfaces Simultaneously

Abstract

In the present study we develop a new wide-spectral-range high-speed spectrophotometer system which can measure three kinds of spectra of normal-incidence specular reflectance R_<NN> and normal incidence hemispherical reflectance R_<NH> at 93 wavelength points in the near-ultraviolet through infrared region of 0.30〜11 μm, and normal emittance ε_N at 42 wavelength points in the infrared region of 2.0〜11 μm simultaneously and repeatedly with a cycle time of 8 s.