The Proceedings of Conference of Kyushu Branch
Online ISSN : 2424-2780
2000.53
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612 Application of Moire Interferometry to Thermal Deformation of IC Packages
Kazuo ARAKAWAMitsugu TODOShinji YAMADAKiyoshi TAKAHASHI
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 187-188

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© 2000 The Japan Society of Mechanical Engineers
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