The Proceedings of the Machine Design and Tribology Division meeting in JSME
Online ISSN : 2424-3051
2012.12
Session ID : 2206
Conference information
2206 Fabrication of narrow Ditch grating pattern using ICP-RIE
Daiji NODAAtsushi TOKUOKATadashi HATTORI
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract
Silicon dry etching technology makes it possible to fabricate rectangular structures by repeating two steps of etching process and protection process. Therefore, our research introduces the ability of Si dry etching technology in order to fabricate un-tapered, high precision microstructures containing rectangular grating patterns with narrow pitch of submicron level. In the present study, a high precision Si microstructure was fabricated using ICP-RIE apparatus. In these techniques, we have succeeded in fabricating about 40 μrn height, void-free gold microstructures in a space as narrow as 2.6 μm in large effective area of 60 mm squares. In this research, we are trying narrower space and high aspect ratio microstructures. Therefore, it is expected to be used in the production of a wide variety of micro-devices that have not yet been put into practice.
Content from these authors
© 2012 The Japan Society of Mechanical Engineers
Previous article Next article
feedback
Top