The Proceedings of Mechanical Engineering Congress, Japan
Online ISSN : 2424-2667
ISSN-L : 2424-2667
[volume title in Japanese]
Session ID : J0120105
Conference information

Bonding Strength Evaluation of Encapsulation Resin for Power Electronic Devices at High Temperature
Toru IKEDAAkiko OZAKIMasaaki KOGANEMARUHiroshi NAKAIDOTakuya HATAO
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Abstract

Power devices are used for resent cars, trains, electric supply system and so on. They are one of the key technologies for saving energy and reducing carbon oxide. Power devises used to be encapsulated in soft gel. However, the encapsulation material is changing to molding resin due to the low cost and higher reliability. Because the power devices in next generation will be used under the temperature higher than 200 °C, the delamination of the molding resin due to thermal stress is the problem to solve. It is important to evaluate the reliability of the delamination between the molding resin and a print circuit substrate in power devices. We will provide the evaluation technique of the delamination reliability of the molding resin.

Content from these authors
© 2016 The Japan Society of Mechanical Engineers
Previous article Next article
feedback
Top