The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
2002.2
Conference information
A Study of the Damage Process in Conductive Thin Film on High Polymer Film
Takao TOYODATomonaga OKABEMasaaki YANAKANobuo TAKEDAMasao SHIMIZU
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Pages 455-456

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Abstract

The present paper investigates the relationship between crack phenomena and electric resistance of an ITO thin film on polymer film. The electrical conductivity of ITO film was decreases due to the multiple film cracking. In order to predict the variation of electrical conductivity of ITO film with applied strain, we conducted the Monte Carlo simulation with a finite element analysis. This numerical procedure can easily and accurately calculate the stress distribution in the film on the elastic-plastic substrate. The predictions are found to have good agreements with the experimental results.

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© 2002 The Japan Society of Mechanical Engineers
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