Depth measuring by pattern projection

Abstract

In the field of the computer vision, it is important to recover the three-dimensional scene from the two-dimensional images. In this study, we address the depth measuring by the pattern projection. The method of using two cameras is proposed as a general method for the depth measuring. In this method, the depth from the target object to the camera cannot be measured for some objective shape, surface pattern, etc. In this study, we put on a projector one side of two viewpoints in the stereo method, and coded pattern images are projected from it to measuring space, and the depth from the target object to the camera is measured from the coded pattern images. In this depth measuring, it is important to investigate the internal parameters and the external parameters of camera and projector. So, in this study, we investigate these parameters by the calibration.