The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
2004.1
Session ID : 901
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Debelopment of On-chip Micro Tensile Testing Device for Mechanical-Electrical Characteristics of Carbon Nanowires
Mario KiuchiYoshitada IsonoSusumu SugiyamaTakahiko MoritaShinji Matsui
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Abstract
This paper reports new development of a tensile testing device driven by electrostatic actuator array for revealing mechanical and electrical properties of carbon nanowires used for nanomechanical sensors. The design concept of tensile testing device, are presented, which is composed of three elements; a carbon nanowire, electrostatic actuator array for applying uniaxial load to the nanowire and a cantilever for calibrating load and displacement. The fabrication process of the device using an SOI wafer is also established for high-accuracy arrangement of the nanowire on the testing device with the actuator array. The uniaxial tensile testing was demonstrated in order to obtain the force-displacement relation of the carbon nanowires.
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© 2004 The Japan Society of Mechanical Engineers
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