The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
2006.1
Session ID : 3540
Conference information
3540 Effect of Trace Impurities on Fatigue Strength of Ultrafine Grain Copper
Masahiro GOTOSeung-Zeon HANTerutoshi YAKUSHIJICha-Yong Lim
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2006 The Japan Society of Mechanical Engineers
Previous article Next article
feedback
Top