Abstract
Secondary buckling behavior of functionally graded thin films under biaxial compression is studied. Elastic stiffness constants of the film are dependent on the coordinate variable in the thickness direction of the film. First we briefly present the governing equations of functionally graded thin films. Next we make the postbuckling analysis and derive the exact deflection and stress function in Euler buckling state. These solutions allow us to analyze secondary buckling phenomena. Finally, we study the secondary buckling behavior by use of the Galerkin method. The effects of the material inhomogeneity on the secondary buckling behavior is discussed.
