The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
2008.8
Session ID : 302
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302 Development of improved dual-axis micro-mechanical probe for friction force microscope
Hiroaki AmakawaKenji FukuzawaHedong ZhangShintaro ItohMitsuhiro Shikida
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Conventional friction force microscope (FFM) had the disadvantage of low force sensitivity due to mechanical interference between torsion caused by friction force and caused deflection by normal force. We have developed dual-axis micro-mechanical probe. It measures the lateral force by detecting the deflection of the double cantilever and measures the vertical force by the torsion beam. However, the method of calibrating the probe lateral deflection has not been established. In this study, we present a new method precisely which calibrates the probe lateral displacement in order to detect the friction force.
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© 2008 The Japan Society of Mechanical Engineers
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