The Proceedings of the Materials and Mechanics Conference
Online ISSN : 2424-2845
2008
Session ID : PS08
Conference information
PS08 Consideration of the Optimum Crystallographic Parameter to Detect Fatigue Damage by Electron Backscatter Diffraction
Takayuki MORI, Jyunpei SHIBATA, Masayuki KAMAYA, Masatoshi KURODA, Kazuya MORI
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Keywords: SCC, EBSD, Low cycle fatigue, Crystallographic deformation, Grain boundary
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[in Japanese]
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© 2008 The Japan Society of Mechanical Engineers
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Proceedings of the 1992 Annual Meeting of JSME/MMD

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