Study on the effect of annealing on the mechanical properties of nanocrystalline nickel thin films based on X-ray profile analysis

Abstract

Four types of test specimens of nanocrystalline nickel thin films were prepared: As-deposited material without annealing, and specimens annealed at 473K, 523K, and 573K, respectively. Tensile and fatigue tests were conducted on each specimen, and stress-strain curves and S-N diagrams were created. The effect of annealing on the mechanical properties was investigated based on the difference in crystal structure analyzed from profiles obtained from synchrotron radiation X-rays.