The Proceedings of The Manufacturing & Machine Tool Conference
Online ISSN : 2424-3094
2004.5
Session ID : 312
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Optical measurement of spindle run-out error by virtual V-block method
Tetsugo ISHIDAKazuhisa YANAGIRyuichi YAMADA
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Abstract
A run-out measuring instrument with capacitance displacement probe is widely used in industry. However, this measurement method has the defect that measurement result depend on a feature of measured object. Furthermore, attachment error between measured object and spindle is never detected in measurement at are section. In this paper, we compare the optical measurement by virtual V-block method which does not depend on a feature of a measured subject to 2-point method with capacitance displacement probe in view of measurement principle. And we show how to separate the attachment error from the run-out error of a spindle.
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© 2004 The Japan Society of Mechanical Engineers
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