The Proceedings of The Manufacturing & Machine Tool Conference
Online ISSN : 2424-3094
2006.6
Session ID : 406
Conference information
406 Development of Non-contact On-machine Profile Measuring System with Laser Probe
Shinya MoritaHitoshi OhmoriWeimin LinYoshihiro UeharaYutaka Watanabe
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Optical components with micro groove structures like diffraction gratings, light guide plates or holographic optical elements require extremery high form accuracy and ultra-fine smooth surface quality of sub-nanometer or sub-angstrom in Ra. To achieve these requirements, ultaprecision on-machine measurement system in very important, by which the profile measurement and evaluation is conducted on the machine, the form accuracy by the compensating machining when the form accuracy in not enough. So, on-machine profile measuring system with non-contact laser type probe has been developed.
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© 2006 The Japan Society of Mechanical Engineers
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