327 On Young's Modulus and Yield Stress of Single Crystalline Al Microwires

The Proceedings of the Materials and processing conference

Online ISSN : 2424-287X

2012.20

Session ID : 327

DOI https://doi.org/10.1299/jsmemp.2012.20._327-1_

Conference information

327 On Young's Modulus and Yield Stress of Single Crystalline Al Microwires

Hironori TOHMYOH, Md. Abdus Salam AKANDA, Yuki NOBE, Masumi SAKA

Author information

Keywords: Aluminium, Microwire, Single Crystal, Young's Modulus, Yield Stress

CONFERENCE PROCEEDINGS FREE ACCESS

Details

Article 1st page

Content from these authors

© 2012 The Japan Society of Mechanical Engineers

Favorites & Alerts

Related articles

Recently viewed articles

Announcements from publisher

You can find subscription number and password for J-STAGE on the page below after logging in:
https://www.jsme.or.jp/publication/proceedings/

Top