Proceedings of thermal engineering conference
Online ISSN : 2433-1317
2001
Session ID : TF-1/C118
Conference information
C118 Diffusion mechanism analysis of point defects in semiconductors by molecular dynamics
Koichi KAKIMOTOShin-ichiro NOGUCHIHiroyuki OZOE
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
This paper aims to study diffusion mechanism of point defects such as vacancies and interstitials of silicon in silicon-germanium solid solution using molecular dynamics simulation. Moreover, equilibrium volume of the silicon, germanium and these alloys were also estimated by using two different schemes of constant volume. The calculation revealed that diffusion constants of the point defects are almost independent of external pressure. Furthermore, volume of the system changed almost isotropically.
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© 2001 The Japan Society of Mechanical Engineers
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