Abstract
CoxPt100-x (33 ≤ x ≤ 97) thin films were fabricated by RF sputtering method with various sputtering Ar gas pressure PAr and film thickness t and applied to hard magnetic tips for Magnetic Force Microscopy (MFM). The coercivity Hc of Co-Pt films, which were fabricated under high PAr, increased in the Co concentration range beyond 60at. % Co. The maximum value of μ0Hc, 0.27T was obtained for the Co79Pt21 films with PAr=10.7Pa and t=40nm. X-ray diffraction analysis revealed that hcp phase exists in the films with high coercivity. The anisotropy field μ0Ha of the hcp phase was estimated about 1.0T by singular point detection technique. The high coercivity of the films is attributed to domain wall pinning from the minor loop behavior. The MFM tips with Co79Pt21 films on Si cantilevers gave finer contrast in MFM images than commercial CoCr MFM tips for magnetic recording media.