Journal of the Society of Materials Engineering for Resources of Japan
Online ISSN : 1884-6610
Print ISSN : 0919-9853
ISSN-L : 0919-9853
Use of Auger Parameter in the Characterization of Chemical State by X-ray Photoelectron Spectroscopy: A Review
Hideaki MONJUSHIRO
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2006 Volume 18 Issue 1-2 Pages 1-9

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Abstract
In this review the concept of Auger parameter and its applications for the XPS analysis of materials and their surfaces are described. First, the definition of the Auger parameter and the experimental methods to obtain the Auger parameter are introduced. Then the physical meaning of the Auger parameter is clarified and the relations between the bulk properties of materials, such as polarizability, refractive index, and band-gap, and the Auger parameter is interpreted. The recent applications of Auger parameter for the analysis of materials and their surfaces, such as alloys, thin films, surface layers, clusters, catalysis, and surface corrosion, are reviewed.
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