Abstract
In Japan long waiting times at level crossings is a social issue. To solve this problem effectively we have developed a microelectronic level crossing controller with built-in constant warning time control logic. Conventional logic would require extensive design and construction as well as testing would as logic is different at each crossing. We succeeded constructing logic without track circuit information and standardizing logic by implementing two train counting logics. Next we carried out indoor tests. For this test, a number of test patterns based on the experience and knowledge of developers were systematically examined and implemented. In this test we have systematically examined many test patterns which were restricted within human experience and knowledge conventionally. Specifically, possible events are listed at each stage of the life cycle of RAMS (IEC62278), and test items are described with both top-down FTA (Fault Tree Analysis) approach and bottom-up FMEA (Failure Mode and Effect Analysis) approach. Moreover we narrowed down the test patterns by focusing on both number of items and number of procedures to carry out in a limited period of time. Finally we carried out a field test to evaluate functions and environmental resistance during long-time operation in the field environment at Hikawa crossing between Omiya and Toro on the Tohoku line over 8 months. As the result of the indoor test and field test were successful, we are planning to commercialize our level crossing controller in fiscal 2015. By using our development, we expect to reduce time for design, construction and testing. Furthermore, we also expect to reduce the number of relays and lead to reductions in cost. By the above-mentioned effect, our development leads to promote introduction of constant warning time control for level crossing and contribute to society.
