The Proceedings of the Thermal Engineering Conference
Online ISSN : 2424-290X
2012
Session ID : H131
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H131 Evaluation of Heat Generation of Si Power MOSFET using Electro-Thermal Analysis
Risako KibushiTomoyuki HatakeyamaMasaru Ishizuka
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Abstract
This paper describes thermal and electrical properties of Si power MOSFET. The problem of hot spot in submicron scla Si MOSFET has been widely known. Recently, Si power MOSFET is key device in a lot of area, for example car electronics. In Si power MOSFET, high voltage is applied and high current is generated. Therefore, heat generation becomes higher and thermal management is important. In this paper, thermal and electrical properties of Si power MOSFET is evaluated with Electro-Thermal Analysis and fundamental heat generation phenomenon of Si power MOSFET is discussed. Further, generation of hot spot is also discussed.
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© 2012 The Japan Society of Mechanical Engineers
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