Host: The Japan Society of Mechanical Engineers
Name : [in Japanese]
Date : October 09, 2021 - October 10, 2021
For thermal design, it is necessary to know the thermal properties such as thermal conductivity with high accuracy. We have developed an apparatus based on ASTM E1530 and D5470, but it is necessary to measure samples of the same material with different thicknesses in order to measure the thermal conductivity considering the thermal contact resistance. In this study, we investigated a method to measure the thermal conductivity considering the thermal contact resistance from a single sample. The measurement results of the conventional method and the proposed method were compared in a measurement system with an infrared thermography camera added to the measurement system of the conventional method.
