The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2002.37
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Nanometer-Resolution Mapping of Local Elasticity by a Sensitive AFM Cantilever with its Mass Concentrated
Hiroki KAMATA, Mikio MURAOKA
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Keywords: Material Characterization, Atomic Force Microscopy, Elastic Image, Resonance, Concentrated Mass
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Pages 14-15

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© 2002 The Japan Society of Mechanical Engineers
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