The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2008.43
Session ID : 106
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106 Experimental Estimation of Threshold Current Density of Electromigration Damage in Polycrystalline Al Line
Akihiko KIRITA, Shota FUKUSHI, Nao YAMAJI, Kazuhiko SASAGAWA
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Keywords: Electromigration, Atomic Flux Divergence, Drift, Polycrystalline Line, Threshold Current Density
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© 2008 The Japan Society of Mechanical Engineers
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